منابع مشابه
Optical fiber tip templating using direct focused ion beam milling
We report on a method for integrating sub-wavelength resonant structures on top of optical fiber tip. Our fabrication technique is based on direct milling of the glass on the fiber facet by means of focused ion beam. The patterned fiber tip acts as a structured template for successive depositions of any responsive or functional overlay. The proposed method is validated by depositing on the patt...
متن کاملRecent developments in nanofabrication using focused ion beams.
Focused ion beam (FIB) technology has become increasingly popular in the fabrication of nanoscale structures. In this paper, the recent developments of the FIB technology are examined with emphasis on its ability to fabricate a wide variety of nanostructures. FIB-based nanofabrication involves four major approaches: milling, implantation, ion-induced deposition, and ion-assisted etching of mate...
متن کاملMorphology Control of Carbon Nanotubes through Focused Ion Beams
This research demonstrates the capability of controlled, focused ion beam (FIB)–assisted tailoring of morphologies in both multiwall carbon nanotubes (CNTs) and Y junction nonlinear CNT systems through defect engineering. We have shown that a 30 keV FIB Ga ion beam at low ion milling currents of 1 pA can be used to partially reduce the CNT diameter, to provide electrical conduction bottleneck m...
متن کاملFocused ion beam sample preparation for atom probe tomography
Atom Probe (AP) tomography is maturing into a routine method for the atomic resolution compositional analysis of metals, semiconductors and some polymers. This is often combined with a Transmission Electron Microscope (TEM) analysis of the same region of interest. The Focused Ion Beam (FIB) microscope has evolved as an essential tool for site and orientation specific sample preparation for such...
متن کاملScattering of focused beams by tenuous particles.
This paper deals with the problem of the scattering of focused laser beams by tenuous particles using an iterative technique. The results are shown to be accurate provided that (a) the polarizability of the particle medium is small and (b) the phase shift of the central ray is less than 2. It was found that when the size of the incident beam waist is close to that of the scatterer, the scattere...
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ژورنال
عنوان ژورنال: SHINKU
سال: 1995
ISSN: 0559-8516,1880-9413
DOI: 10.3131/jvsj.38.401